Peranti pengukur ketebalan lapisan sinar-XHelmut Fischer
FISCHERSCOPE XDL-XYZpT8
Peranti pengukur ketebalan lapisan sinar-X
Helmut Fischer
FISCHERSCOPE XDL-XYZpT8
Harga tetap ditambah cukai perkhidmatan
€3,500
Keadaan
Terpakai
Lokasi
Borken 

Data mesin
- Nama mesin:
- Peranti pengukur ketebalan lapisan sinar-X
- Pengeluar:
- Helmut Fischer
- Model:
- FISCHERSCOPE XDL-XYZpT8
- Keadaan:
- sangat baik (terpakai)
Harga & Lokasi
Harga tetap ditambah cukai perkhidmatan
€3,500
- Lokasi:
- Einsteinstraße 8a, 46325 Borken, Deutschland

Hubungi
Butiran tawaran
- ID iklan:
- A22811900
- Nombor rujukan:
- 25371
- Kemas kini:
- terakhir pada 25.09.2026
Penerangan
HELMUT FISCHER
X-ray fluorescence measuring device / film thickness measuring device
FISCHERSCOPE X-RAY XDL-XYZpT8
Professional X-ray fluorescence measuring system
for film thickness and material analysis
For sale is a used X-ray fluorescence measuring device
from the manufacturer Helmut Fischer GmbH + Co. KG, Germany.
The FISCHERSCOPE X-RAY is suitable for non-destructive film thickness measurement
and material analysis using X-ray fluorescence (XRF).
The system is designed for measurements of functional layers, anti-corrosion layers,
and various metallic coatings, and is used in quality assurance, laboratories,
research, and manufacturing.
Technical data:
Manufacturer: Helmut Fischer GmbH + Co. KG
Model: FISCHERSCOPE X-RAY
Type: XDL-XYZpT8
Serial number: SN010002436
Made in Germany
CE marking present
Measuring system:
X-ray fluorescence measuring device (XRF)
For non-destructive film thickness measurement
Suitable for functional layers and anti-corrosion layers
Large measuring chamber with C-shaped slit
Standard X-ray tube
Proportional counter
Fixed aperture and fixed filter
DCM travel 0–80 mm
Electrical data:
Supply voltage: 230 V AC
Frequency: 50–60 Hz
Power consumption: 120 W
Connections:
Power connection
Serial interface (Sub-D)
Other connections as shown in the pictures
Equipment:
Helmut Fischer FISCHERSCOPE X-RAY measuring device
Measuring chamber with protective cover
Software
Operating manual
Additional accessories as shown in the pictures
Areas of application:
Film thickness measurement
Material analysis
X-ray fluorescence analysis (XRF)
Quality assurance
Electroplating
Surface technology
Material testing
Laboratory
Research and development
Scope of supply:
Helmut Fischer FISCHERSCOPE X-RAY XDL-XYZpT8
Software
Operating manual
Scope of supply as shown in the pictures
Condition:
Used
The device comes from a warehouse clearance.
Optical condition as shown in the pictures.
Important note:
The device has not been tested by us and is sold explicitly
as is and without warranty.
The table shown in the photos, as well as other items not explicitly
mentioned, are not part of the sale.
Nljdpfxsz Egi Ro Ai Heg
Due to its size and weight, shipping can be arranged via a freight forwarder.
Subject to changes, errors and prior sale.
We will be happy to answer any further questions by telephone.
Iklan ini diterjemahkan secara automatik. Mungkin terdapat kesilapan terjemahan.
X-ray fluorescence measuring device / film thickness measuring device
FISCHERSCOPE X-RAY XDL-XYZpT8
Professional X-ray fluorescence measuring system
for film thickness and material analysis
For sale is a used X-ray fluorescence measuring device
from the manufacturer Helmut Fischer GmbH + Co. KG, Germany.
The FISCHERSCOPE X-RAY is suitable for non-destructive film thickness measurement
and material analysis using X-ray fluorescence (XRF).
The system is designed for measurements of functional layers, anti-corrosion layers,
and various metallic coatings, and is used in quality assurance, laboratories,
research, and manufacturing.
Technical data:
Manufacturer: Helmut Fischer GmbH + Co. KG
Model: FISCHERSCOPE X-RAY
Type: XDL-XYZpT8
Serial number: SN010002436
Made in Germany
CE marking present
Measuring system:
X-ray fluorescence measuring device (XRF)
For non-destructive film thickness measurement
Suitable for functional layers and anti-corrosion layers
Large measuring chamber with C-shaped slit
Standard X-ray tube
Proportional counter
Fixed aperture and fixed filter
DCM travel 0–80 mm
Electrical data:
Supply voltage: 230 V AC
Frequency: 50–60 Hz
Power consumption: 120 W
Connections:
Power connection
Serial interface (Sub-D)
Other connections as shown in the pictures
Equipment:
Helmut Fischer FISCHERSCOPE X-RAY measuring device
Measuring chamber with protective cover
Software
Operating manual
Additional accessories as shown in the pictures
Areas of application:
Film thickness measurement
Material analysis
X-ray fluorescence analysis (XRF)
Quality assurance
Electroplating
Surface technology
Material testing
Laboratory
Research and development
Scope of supply:
Helmut Fischer FISCHERSCOPE X-RAY XDL-XYZpT8
Software
Operating manual
Scope of supply as shown in the pictures
Condition:
Used
The device comes from a warehouse clearance.
Optical condition as shown in the pictures.
Important note:
The device has not been tested by us and is sold explicitly
as is and without warranty.
The table shown in the photos, as well as other items not explicitly
mentioned, are not part of the sale.
Nljdpfxsz Egi Ro Ai Heg
Due to its size and weight, shipping can be arranged via a freight forwarder.
Subject to changes, errors and prior sale.
We will be happy to answer any further questions by telephone.
Iklan ini diterjemahkan secara automatik. Mungkin terdapat kesilapan terjemahan.
Hantar permintaan
Telefon & Faks
+49 2861 ... iklan
Iklan-iklan ini juga mungkin menarik minat anda.
Berjaya
Mesej anda telah dihantar.
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Borken
10,005 km
Plat pengukur
Helmut Fischer FischerscopeXDL-B XYmZ
Helmut Fischer FischerscopeXDL-B XYmZ
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