Sistem pengukuranASML
YieldStar S-200B
Sistem pengukuran
ASML
YieldStar S-200B
tahun pembuatan
2011
Keadaan
Terpakai
Lokasi
Dresden 

Gambar menunjukkan
Tunjukkan peta
Data mesin
- Nama mesin:
- Sistem pengukuran
- Pengeluar:
- ASML
- Model:
- YieldStar S-200B
- Tahun pembuatan:
- 2011
- Keadaan:
- sangat baik (terpakai)
- Fungsi:
- berfungsi sepenuhnya
Harga & Lokasi
- Lokasi:
- Heilbronner Str. 22, 01189 Dresden, Deutschland

Hubungi
Butiran tawaran
- ID iklan:
- A19967480
- Nombor rujukan:
- DV10125
- Kemas kini:
- terakhir pada 10.09.2025
Penerangan
Optical overlay metrology system, Advanced Semiconductor Materials Lithography stand-alone overlay metrology system for 300 mm wafers, YieldStar S 200B
Model: S200B
Type: YieldStar
Year of manufacture: 2011
Technical data:
Wafer size: 300 mm (12")
Laser source: LPPS, water cooling
General information:
Dcsdpoxbnt Ejfx Ad Dsr
The YSS200B is an optical overlay measurement system used for fast and highly precise measurement of overlay deviations on 300 mm wafers – typically for post-etch monitoring and production process control as a stand-alone system.
Iklan ini diterjemahkan secara automatik. Mungkin terdapat kesilapan terjemahan.
Model: S200B
Type: YieldStar
Year of manufacture: 2011
Technical data:
Wafer size: 300 mm (12")
Laser source: LPPS, water cooling
General information:
Dcsdpoxbnt Ejfx Ad Dsr
The YSS200B is an optical overlay measurement system used for fast and highly precise measurement of overlay deviations on 300 mm wafers – typically for post-etch monitoring and production process control as a stand-alone system.
Iklan ini diterjemahkan secara automatik. Mungkin terdapat kesilapan terjemahan.
Dokumen
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